Analysis of the graph BadFuzz.gml generated in Part I indicated that
the testing methods used were not effective enough to exhibit
optimal code coverage of the device driver in question. Part II
implemented an improved test case based on the coverage analysis
used in Part I. Graph BetterFuzz.gml allowed test executers to view
the improved testing methods to ensure that the missed block was
reached. This process revealed a fault in block 00011169 which would
have otherwise remained undetected without code coverage analysis.